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| LEADER |
00623cam a2200193 7i4500 |
| 001 |
0000002913 |
| 005 |
20140626090000.0 |
| 020 |
|
|
|a 0070576971
|
| 090 |
0 |
0 |
|a QC611.24
|b .R86 1998
|
| 100 |
1 |
|
|a Runyan, W. R.
|
| 245 |
1 |
0 |
|a Semiconductor measurements and instrumentation /
|c W.R. Runyan and T.J. Shaffner.
|
| 250 |
|
|
|a 2nd ed.
|
| 260 |
|
|
|a New York:
|b McGraw Hill,
|c 1998.
|
| 300 |
|
|
|a x, 453 p.:
|b ill.;
|c 24 cm.
|
| 504 |
|
|
|a Includes bibliographical references and index.
|
| 650 |
|
0 |
|a Semiconductors.
|
| 650 |
|
0 |
|a Physical measurements.
|
| 700 |
1 |
|
|a Shaffner, T. J.
|
| 999 |
|
|
|a 0000003743
|b Book
|c Open Shelf
|e Perpustakaan CIAST
|
