Semiconductor measurements and instrumentation /

Bibliographic Details
Main Author: Runyan, W. R.
Other Authors: Shaffner, T. J.
Format: Book
Published: New York: McGraw Hill, 1998.
Edition:2nd ed.
Subjects:
Description
Physical Description:x, 453 p.: ill.; 24 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0070576971