Runyan, W. R., & Shaffner, T. J. (1998). Semiconductor measurements and instrumentation (2nd ed.). New York: McGraw Hill.
Chicago Style CitationRunyan, W. R., and T. J. Shaffner. Semiconductor Measurements and Instrumentation. 2nd ed. New York: McGraw Hill, 1998.
MLA CitationRunyan, W. R., and T. J. Shaffner. Semiconductor Measurements and Instrumentation. 2nd ed. New York: McGraw Hill, 1998.
Warning: These citations may not always be 100% accurate.