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| LEADER |
00603cam a2200169 7i4500 |
| 001 |
0000002295 |
| 005 |
20131128090000.0 |
| 020 |
|
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|a 0750694726 (hardcover : alk. paper)
|
| 090 |
0 |
0 |
|a TK7874
|b .A339 1995
|
| 100 |
1 |
|
|a Afshar, Amir.
|
| 245 |
1 |
0 |
|a Principles of semiconductor network testing /
|c Amir Afshar.
|
| 260 |
|
|
|a Boston:
|b Butterworth-Heinemann,
|c 1995.
|
| 300 |
|
|
|a xiv, 213 p.:
|b ill.;
|c 25 cm.
|
| 504 |
|
|
|a Includes bibliographical references and index.
|
| 650 |
|
0 |
|a Integrated circuits --
|x Testing.
|
| 650 |
|
0 |
|a Semiconductors --
|x Testing.
|
| 999 |
|
|
|a 0000002882
|b Book
|c Open Shelf
|e Perpustakaan CIAST
|
