Principles of semiconductor network testing /

Bibliographic Details
Main Author: Afshar, Amir.
Format: Book
Published: Boston: Butterworth-Heinemann, 1995.
Subjects:
Description
Physical Description:xiv, 213 p.: ill.; 25 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0750694726 (hardcover : alk. paper)