Semiconductor measurements and instrumentation /
| Main Author: | |
|---|---|
| Format: | Book |
| Published: |
New York:
McGraw-Hill,
[1975].
|
| Series: | Texas Instruments electronics series
|
| Subjects: |
| LEADER | 00566cam a2200169 7i4500 | ||
|---|---|---|---|
| 001 | 0000002163 | ||
| 005 | 20131010090000.0 | ||
| 020 | |a 0070542732 | ||
| 090 | 0 | 0 | |a QC611.24 |b .R86 1975 |
| 100 | 1 | |a Runyan, W. R. | |
| 245 | 1 | 0 | |a Semiconductor measurements and instrumentation / |c W. R. Runyan. |
| 260 | |a New York: |b McGraw-Hill, |c [1975]. | ||
| 300 | |a vii, 280 p.: |b ill.; |c 26 cm. | ||
| 490 | 0 | |a Texas Instruments electronics series | |
| 504 | |a Includes bibliographical references and index. | ||
| 650 | 0 | |a Semiconductors. | |
| 999 | |a 0000002725 |b Book |c Open Shelf |e Perpustakaan CIAST | ||